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MEMS Probing Solutions

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Product Properties
Description
  • Manual, Semi-automatic & Fully Automatic Versions
  • Single-Sided or Double-Sided
  • Vacuum (semi and fully automatic)
  • Applications: Sensors, Accelerometers, Gyroscopes, Microbolometers, Silicon Photonics (DC, HF), Microfluidics
  • Thermal Systems from -60°C to 300°C
  • In-Plane and Out-of-Plane Measurements
  • Customized Chucks and Carrier Plates
  • Integrating Spheres or Fibers (single or multi-mode)
  • Manipulators – manual, programmable and hexapods
  • Non-Contact Height Measurement Sensors
  • Probe Tips, Probe Cards, Wedges
  • Integrated Solutions
  • Modular PS4L (Probe station for life) Hardware & Software Architecture
  • It is possible to combine features from different probing solutions. Please connect through the request quote form.
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